High-precision white light interferometer sensor using white light interference principle for nanometer-level precision measurement. Suitable for optical inspection, surface roughness measurement, precision machining and other high-tech fields.
| Model | CWL050R040 |
| Measurement Principle | White Light Interferometry |
| Measurement Range | 50mm |
| Reference Distance | ±0.1mm |
| Resolution | 10nm |
| Repeatability | 20nm |
| Dimensions | φ60×120mm |
| Weight | 500g |
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